Journal Publications
* Denotes student
** Denotes non-faculty
# Most Recent Impact Factor
1. *Coutu, Jr., R.A. and Kladitis, P.E., “Modeling and Simulation of Classical MicroElectro-Mechanical Systems (MEMS) Actuators,” AIAA Student Journal, vol. Spring, pp. 46-54, 2002. – (# NA)
2. *Coutu, Jr., R.A., Kladitis, P.E., Starman, L.A. and **Reid, J.R., “A Comparison of Micro-Switch Analytic, Finite Element, and Experimental Results,” Sensors and Actuators A., vol. 115, pp. 252-258, 2004. – (# 1.769)
3. Coutu, Jr., R.A., Kladitis, P.E., Leedy, K.D. and Crane, R.L., “Selecting Metal Alloy Electric Contact Materials for MEMS Switches,” Institute of Physics (IOP) Journal of Micromechanics and Microengineering, vol. 14, pp. 1157-1164, 2004. – (# 1.731)
4. *Lee, H., Coutu, Jr., R.A., Mall, S. and Kladitis, P.E., “Nanoindentation technique for characterizing cantilever beam style RF MEMS switches,” IOP Journal of Micromechanics and Microengineering., vol. 15, pp. 1230-1235, 2005. – (# 1.731)
5. Coutu, Jr., R.A., **Reid, J.R., **Cortez, R., **Strawser, R.E. and Kladitis, P.E., “Microswitches with Sputtered Au, AuPd, Au-on-AuPt, and AuPtCu Alloy Electric Contacts”, IEEE Transactions on Components & Packaging Technologies, vol. 29, no. 2, pp. 341-349, 2006. – (# 1.180)
6. *Lee, H., Coutu, Jr., R.A., Mall, S. and **Leedy, K.D., “Characterization of metal and metal alloy films as contact materials for MEMS switches,” IOP Journal of Micromechanics and Microengineering., vol. 16, pp. 557-563, 2006. – (# 1.731)
7. *Crossley, B.L., *Kossler, M., Coutu, Jr., R.A., Starman, L.A. and Collins, P.J., “Effects of Hydrogen Pretreatment on Physical-Vapor-Deposited Nickel Catalyst for 20 Multi-Walled Carbon Nanotube Growth,” Journal of Nanophotonics, vol. 4, 049502, pp. 1-6, 2010. – (# 1.686)
8. *Wagner, T.J., **Bohn, M.J., Coutu, Jr, R.A., **Gonzalez, L.P., **Murray, J.A., **Schepler, K.L. and **Guha S. “Measurement and modeling of infrared nonlinear absorption coefficients and laser-induced damage thresholds in Ge and GaSb,” J. of the Optical Society of America B, vol 27, no. 10, pp. 2122-2131, 2010. – (# 1.97)
9. *Ostrow II, S.A. and Coutu, Jr., R.A., “Novel microelectromechanical systems image reversal fabrication process based on robust SU-8 masking layers”, Journal of Micro/Nanolithography, MEMS and MOEMS (JM3), vol. 10, no. 3, pp. 033016-1 – 033016-7, 2011. – (# 1.428)
10. Coutu, Jr., R.A., Collins, P.J., *Moore, E.A., *Langley, D., *Jussuame, M.E. and Starman, L.A., “Electrostatically Tunable Meta-Atoms Integrated with In-Situ Fabricated MEMS Cantilever Beam Arrays,” IEEE/ASME Journal of Microelectromechanical Systems, vol. 20, no. 6, pp. 1366-1371, 2011. – (# 1.754)
11. *Moore, E.A., *Langley, D., *Jussaume, M.E., *Rederus, L.A., *Lundell, C.A., Coutu, Jr., R.A., Collins, P.J. and Starman, L.A., “SRRs Embedded with MEMS Cantilevers to Enable Electrostatic Tuning of the Resonant Frequency,” Journal of Experimental Mechanics, vol. 52, pp. 395-403, 2012. (Digital Object Identifier (DOI) 10.1007/s11340-011-9498-8) – (# 1.764)
12. *Ostrow II, S.A., *Lake, R.A., *Lombardi, J.P., Coutu, Jr., R.A. and Starman, L.A., “Fabrication Process Comparison and Dynamics Evaluation of Electrothermal Actuators for a Prototype MEMS Safe and Arming Device,” Journal of Experimental Mech., vol. 52, pp. 1229-1238, 2012. (DOI 10.1007/s11340-011-9579-8) – (# 1.764)
13. Starman, L.A. and Coutu, Jr., R.A. “Stress Monitoring of Post-Processed MEMS Silicon Microbridge Structures Using Raman Spectroscopy,” Journal of Experimental Mech., vol. 52, pp. 1341-1353, 2012. (DOI 10.1007/s11340-011-9586-9) – (# 1.764)
14. *Langley, D., Coutu, Jr., R.A. and Collins, P.J. “Low-loss meta-atom for improved resonance response,” American Institute of Physics (AIP) Advances, vol. 2, .012196, pp. 1-5, 2012. (DOI) 10.1063/1.3701709) – (# 1.591)
15. Starman, L.A., and Coutu, Jr., R.A., “Using Micro-Raman Spectroscopy to Assess MEMS Si/SiO2 Membranes Exhibiting Negative Spring Constant Behavior,” Journal of Experimental Mechanics, vol. 53, pp. 593-604, 2012. (DOI 10.1007/s11340-012- 9656-7) – (# 1.764)
16. *Christiansen, B.D, **Heller, E.R., Coutu, Jr., R.A., **Ventury, R. and **Shealy, J.B., “A Very Robust AlGaN/GaN HEMT Technology to High Forward Gate Bias and Current,” Hindawi Publishing Corporation, Journal of Active and Passive Electronic Components, vol. 2012, article ID 493239, pp. 1-4, 2012. (DOI 10.1155/2012/493239) – (# N/A)
17. *Langley, D., Coutu, Jr., R.A. and Collins, P.J., “Using Inductance as a Tuning Parameter for RF Meta-atoms,” Nano-Micro Letters, vol. 4, no. 2, pp. 103-109, 2012. (DOI 10.3786/nml.v4i2.p103-109) – (# 1.975)
18. *Paul, J.V., Collins, P.J. and Coutu, Jr., R.A., “A New Look at Azimuthal Wave Propagation Constants of an n-Layered Dielectric Coated PEC Cylinder,” IEEE Trans. on Antennas and Propagation, vol. 61, no. 5, pp. 2727-2734, 2013. – (# 2.181)
19. *Paul, J.V., Collins, P.J. and Coutu, Jr., R.A., “An efficient cost function for the optimization of an n-layered isotropic cloaked cylinder,” IOP Journal of Physics D: 21 Applied Physics, vol. 46, 335101, pp. 1-8, 2013. (DOI 10.1088/0022- 3727/46/33/335101) – (# 2.721)
20. *Toler, B.F., Coutu, Jr., R.A. and McBride J.W., “A review of micro-contact physics for microelectromechanical systems (MEMS) metal contact switches,” IOP Journal of Microengineering and Micromechanics, vol. 23, 103001, pp. 1-16, 2013. (DOI 10.1088/0960-1317/23/10/103001) – (# 1.731)
21. Coutu, Jr., R.A. and *Ostrow II, S.A., “Microelectromechanical Systems (MEMS) Resistive Heaters as Circuit Protection Devices,” IEEE Transactions on Components, Packaging and Manufacturing Technology, vol. 3, no. 12, pp. 2174-2179, December 2013. (DOI 10.1109/TCPMT.2013.2282362) – (# 1.180)
22. *Glauvitz, N.E., Coutu, Jr., R.A., Medvedev, I.R. and Petkie, D.T., “MEMS Cantilever-based Design for Terahertz Photoacoustic Sensor,” IEEE/ASME Journal of Microelectromechanical Systems, vol. 24, no. 1, pp. 216-223, February 2015. (DOI: 10.1109/JMEMS.2014.2327916) – (# 1.754)
23. *Lake, R.A. and Coutu, Jr., R.A., “Using Cross-linked SU-8 to Flip-Chip Bond, Assemble and Package MEMS Devices,” IEEE Transactions on Components, Packaging and Manufacturing Technology, vol. 5, no. 3, pp. 301-306, March 2015. (DOI: 10.1109/TCPMT.2015.2395999) – (# 1.180)
24. Ren, W., *Chang, C, *Chen, Y., *Xue, S. and Coutu, Jr., R.A., “Investigation of the Surface Adhesion Phenomena and Mechanism of Gold-Plated Contacts at Superlow Making/Breaking Speed,” IEEE Transactions on Components, Packaging and Manufacturing Technology, vol. 5, no. 6, pp. 771-778, 2015. (DOI: 10.1109/TCPMT.2015.2431494) (# 1.180)
25. *Gwin, A.H., *Kodama, C.H., *Laurvick, T.V. and Coutu, Jr., R.A., “Improved terahertz modulation using germanium telluride (GeTe) chalcogenide thin films,” Applied Physics Letters, vol. 107 no. 031904, pp. 1-4, (July 2015). (DOI: 10.1063/1.4927272) – (# 3.302)
26. Coutu, Jr., R.A., Medvedev, I.R. and Petkie, D.T., “Improved Sensitivity MEMS Cantilever Sensor for Terahertz Photoacoustic Spectroscopy,” MDPI Journal of Sensors – Special Issue on Infrared and THz Sensing and Imaging, vol. 16, no. 251, pp 1-11, 2016. – (# 2.245)
27. *Lake, R.A. and Coutu, Jr., R.A., “Variable Response of a Thermally Tuned MEMS Pressure Sensor,” Sensors and Actuators A., vol. 246, pp. 156-162, 2016. (DOI # 10.1016/j.sna.2016.05.018) – (# 1.769)
28. Coutu, Jr., R.A., *LaFleur, R.S., *Walton, J.P.K. and **Starman, L.A., “Thermal Management using MEMS Bimorph Cantilever Beams,” Journal of Experimental Mech., vol. 56, pp. 1293-1303, 2016. (DOI # 10.1007/s11340-016-0170-1) (# 1.764)
29. *Kodama, C.H. and Coutu, Jr., R.A., “Tunable Split-Ring Resonators Using Germanium Telluride,” Applied Physics Letters, vol. 108, no. 231901, pp. 1-6, (June, 2016). (DOI: 10.1063/1.4953228) – (# 3.302)
30. Coutu, Jr., R.A., Lake, R.A., **Christiansen, B.D., **Heller, E.R., **Bozada, C.A., **Poling, B.S., **Via, G.D., **Theimer, J.P., **Tetlak, S.E., **Vetury, R. and **Shealy, J.B., Benefits of Considering More than Temperature Acceleration for GaN HEMT Life Testing,” MDPI Journal of Electronics – Special Issue on Gallium Nitride Electronics, vol. 5, no. 32, pp 1-14, 2016. – (# 2.245)
31. *Laurvick, T.V., Coutu, Jr., R.A., *Sattler, J.M. and Lake, R.A., “Surface Feature Engineering through Nanosphere Lithography,” SPIE Journal of Micro/Nanolithography, MEMS, and MOEMS (JM3), Special Section on Alternative Lithographic Technologies, vol. 15 (3), 031602, pp. 1-11, (2016). (DOI: 10.1117/1.JMM.15.3.031602) – (# 1.731)
32. **Hall, H.J., **Green, A., **Dooley, S., **Schmidt, J., **Starman, L.A., **Langley, D., and Coutu, Jr., R.A., “Mass Reduction Patterning of Silicon-on-Oxide based Micromirrors,” Journal of Micro/Nanolithography, MEMS and MOEMS (JM3), vol. 15, no. 4, pp. 045501-1-045501-12, 2016. (DOI: 10.1117/1.JMM.15.4.045501) – (# 1.428)
33. Coutu, Jr., R.A., “Foreword: Special Section on Electrical Contacts,” IEEE Transactions on Components, Packaging and Manufacturing Technology – Electrical Contacts Special Section, vol. 7, no. 3, pp. 315-316, 2017. (DOI: 10.1109/TCPMT.2017.2673319) – (# 1.180)
34. *Laurvick, T.V. and Coutu, Jr., R.A., “Improving Gold/Gold Micro-contact performance and reliability under low frequency AC through Circuit Loading,” IEEE Transactions on Components, Packaging and Manufacturing Technology – Electrical Contacts Special Section, vol. 7, no. 3, pp. 345-353, 2017. (DOI: 10.1109/TCPMT.2016.2600482) – (# 1.180)
35. *Kaval, W.G., Lake, R.A., Coutu Jr., R.A., “PVDF-TrFE electroactive polymer mechanical-to-electrical energy harvesting experimental bimorph structure,” Material Research Society (MRS) Advances, pp. 1-6, June, 2017. (DOI: https://doi.org/10.1557/adv.2017.397) (# N/A)
36. Ren, W., *Chang, C, *Chen, Y., *Xue, S. and Coutu, Jr., R.A., “Observation and Understanding of the Initial Unstable Electrical Contact Behaviors,” IEEE Transactions on Components, Packaging and Manufacturing Technology, vol. ##, no. ##, pp. 1-8, 2017. (DOI: 10.1109/TCPMT.2017.2695800) (# 1.180)
More of Dr. Coutu’s publications.